Canadian Journal of Physics Working Paper

abstract

  • This work reports results concerning the effect of the deposition parameters on the structural properties of Cu2ZnSnSe4 thin films, grown through a chemical reaction of the metallic precursors via coevaporation in a three-stage process. X-ray diffraction measurements revealed that the samples deposited by selenization of Cu and Sn grow in the Cu 2Se and SnSe2 phases, respectively. The effect of deposition temperature and Cu/Se mass ratio on the transport properties of Cu2ZnSnSe4 films was analyzed. The electrical behavior of the compound was studied. © 2014 Published by NRC Research Press.

publication date

  • 2014/1/1

keywords

  • chemical reactions
  • diffraction
  • mass ratios
  • physics
  • temperature
  • thin films
  • transport properties
  • x rays

number of pages

  • 3

start page

  • 902

end page

  • 904